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April 1, 1983Journal of The Electrochemical SocietyOpen Access

Electrical Properties of Post‐annealed Thin SiO2 Films

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SCSimon S. CohenMIT Lincoln Laboratory

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Simon S. Cohen (1983) studied this question.

synapsesocial.com/papers/6a945de8d1fa461db0c57715 https://doi.org/10.1149/1.2119860

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