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January 1, 1981IEEE Transactions on Nuclear Science

Use of an Ion Microbeam to Study Single Event Upsets in Microcircuits

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AKA.R. KnudsonUnited States Naval Research LaboratoryACA.B. CampbellForschungsverbund Berlin

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Knudson et al. (1981) studied this question.

synapsesocial.com/papers/6a9467aacc4384ea2cc52585https://doi.org/10.1109/tns.1981.4335666
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