X-ray diffraction in the extremely asymmetric laue case with a small angle between the crystal surface and the incident beam

X-ray diffraction phenomena are examined for an extremely asymmetric Laue case with two reciprocal lattice points on the Ewald sphere and a small angle between the crystal surface and the incident beam. The results obtained by means of a modified theory are compared with those obtained by the conventional theory and with values received for the reflection by an amorphous specimen.