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September 15, 1997Applied Physics Letters

Characterization of wafer bonded photodetectors fabricated using various annealing temperatures and ambients

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Authors

BLB. F. LevineAT&T (United States)AHAaron R. HawkinsBrigham Young UniversitySHS. Hiu

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Levine et al. (1997) studied this question.

synapsesocial.com/papers/6a94e12bbfa5337e2a0f2a19https://doi.org/10.1063/1.119950
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