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December 19, 2002Applied Physics Letters

Determination of the azimuthal orientational spread of GaN films by x-ray diffraction

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Authors

YSYue SunChangchun University of TechnologyOBO. BrandtUniversity of StuttgartTLTian Yu LiuPaul Drude Institute for Solid State Electronics

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Sun et al. (2002) studied this question.

synapsesocial.com/papers/6a9555c4fa49e109e125e26chttps://doi.org/10.1063/1.1531832
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