A method is proposed to perform plastic deformation experiments of compound semiconductors at high temperatures under liquid encapsulation with B2O3. This method is applied to CdTe. Several experimental techniques (SIMS, DLTS, capacitance-voltage characteristic of Schottky diodes) are applied to investigate the properties of samples annealed in air and in liquid B203. First results of plastic deformation experiments show an influence of the encapsulant on the plastic properties of CdTe.
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Imhoff et al. (1985) studied this question.
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