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December 4, 2017IEEE Journal of the Electron Devices SocietyOpen Access

AlGaN/GaN MIS-HEMTs With High Quality ALD-Al2O3 Gate Dielectric Using Water and Remote Oxygen Plasma As Oxidants

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Authors

HWHuan-Chung WangTHTing-En HsiehYLYueh-Chin Lin

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Wang et al. (2017) studied this question.

synapsesocial.com/papers/6a9773afff0077060d8bd69bhttps://doi.org/10.1109/jeds.2017.2779172
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