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July 1, 1996Applied Physics Letters

The effect of annealing on the structure and dielectric properties of BaxSr1−xTiO3 ferroelectric thin films

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Authors

LKL.A. KnaussBooz Allen Hamilton (United States)JPJ.M. PondUniversity of Newcastle Australia JHJ. S. HorwitzWesleyan University

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Knauss et al. (1996) studied this question.

synapsesocial.com/papers/6a978f0a0fc5fb4479fac68a https://doi.org/10.1063/1.118106

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