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April 19, 2019IEEE Electron Device Letters

GaN-On-Diamond HEMT Technology With T AVG = 176°C at P DC,max = 56 W/mm Measured by Transient Thermoreflectance Imaging

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Authors

MTMarko J. TadjerUnited States Naval Research LaboratoryTATravis J. AndersonFlorida State UniversityMAMario G. AnconaCentro de Investigación y Proyectos en Ambiente y Desarrollo

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Tadjer et al. (2019) studied this question.

synapsesocial.com/papers/6a97928d64f9dce1da31cc4chttps://doi.org/10.1109/led.2019.2909289
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