Answers are grounded in this paper and cite their sources.
Distortions in the dopant density profile obtained from dc MOSFET measurements due to short-channel effects are not properly predicted by present two-dimensional charge sharing, or charge conservation, models. The comparison of dopant profile data with predictions based on charge conservation models is a powerful technique for evaluating the accuracy of these models.
No takes yet. Share an insight, caveat, or question.
G. P. Carver (1983) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: