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Influences of high-oxygen-pressure (350 MPa) annealing on the properties of leakage current, polarization, and strain were investigated for single crystals of (Bi0.5Na0.5)TiO3-(Bi0.5K0.5)TiO3-BaTiO3 with P4mm tetragonal structure The oxygen annealing led to a marked increase in leakage current, showing that the oxidized crystals have a high concentration of electron hole (carrier) and a low concentration of oxygen vacancy compared with the crystals annealed in air. While the air-annealed crystals exhibited a giant strain up to 0.8% at an electric field of 40 kV/cm, the oxidized crystals showed a small strain less than 0.3%. The results can be explained by the interaction between ferroelectric domains and charged defects.
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Noguchi et al. (2009) studied this question.
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