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August 1, 1998Journal of Applied Physics

Reflectivity study of hexagonal GaN films grown on GaAs: Surface roughness, interface layer, and refractive index

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SSS. ShokhovetsTechnische Universität IlmenauRGR. GoldhahnOtto-von-Guericke University MagdeburgVCV. CimallaFraunhofer Institute for Applied Solid State Physics

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Shokhovets et al. (1998) studied this question.

synapsesocial.com/papers/6a9e09332cea25e31b90d66ehttps://doi.org/10.1063/1.368223
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