A simple model is developed to describe the shape and intensity of the low‐energy peak distortion measured with Si(Li) detectors in X‐RAY SPECTROMETRY. Based on this model, a method is outlined for correcting the distortion channel by channel, which drastically reduces the expense of the deconvolution of the pulse‐height spectra measured in energy‐dispersive X‐ray emission analysis with Si(Li) detectors.
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Heckel et al. (1987) studied this question.
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