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August 9, 2010Applied Physics Letters

Analysis of surface roughness in Ti/Al/Ni/Au Ohmic contact to AlGaN/GaN high electron mobility transistors

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Authors

RGRumin GongPeking UniversityJWJinyan WangXi'an University of Science and TechnologySLShenghou LiuHong Kong University of Science and Technology

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Gong et al. (2010) studied this question.

synapsesocial.com/papers/6aa0150740bc1a697f1df3d9https://doi.org/10.1063/1.3479928
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