Laue distribution of large values of time delay of electrical breakdown in nitrogen

This paper gives the Laue distribution of time delay of electrical breakdown (t d ) for five pressure values of nitrogen in gas-filled diodes. Distributions were obtained for 20% overvoltage, and passive time ( tau ) 5 s and 7.2*10 3 s. The breakdown in nitrogen is induced by long-lived metastable states formed in the previous gas ionisation. The results show that the Laue distributions also hold for such groups of data when t d varies between a fraction of a second and several hundreds of seconds.