First results of the ADC-SAR-05 prototype towards On-chip digitization of the JUNGFRAU charge-integrating X-ray pixel detector

This is the authors' abstract. We don't add key points for this paper.

JUNGFRAU is a state-of-the-art charge-integrating X-ray detector widely used for imaging, diffraction and spectroscopy experiments at synchrotrons and free electron lasers. The current frame rate is 2.2 kHz, limited by analogue signal integrity due to the number of available output pads. With the goal of increasing the frame rate of the detector to over 10 kHz, we have designed a digital 3.125 Gbps high-speed serial readout. Consequently, the development of a fast Analog-To-Digital Converter ADC has become our primary goal to overcome the aforementioned constraints. In addition, on-chip digitization reduces noise pickup and signal distortion caused by wirebonds,traces, and other off-chip components. The ADC has been submitted in June 2024 and arrived at PSI for testing in October 2024. This contribution presents the first characterization results of the new ADC prototype, using standard ADC characterization techniques including statistical histogram testing.