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Hole mobility enhancement in strained-Si/strained-SiGe heterostructure p-MOSFETs fabricated on SiGe-on-insulator (SGOI), Zhiyuan Cheng, Jongwan Jung, Minjoo L Lee, Arthur J Pitera, Judy L Hoyt, Dimitri A Antoniadis, Eugene A Fitzgerald
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Cheng et al. (2004) studied this question.
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