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We examine proton-damaged charge-coupled devices (CCDs) and compare the charge transfer efficiency (CTE) degradation using extended pixel edge response, first pixel response, and /sup 55/Fe X-ray measurements. CTEs measured on Marconi and Fairchild imaging sensors CCDs degrade similarly at all signal levels, though some of the Fairchild CCDs had a supplementary buried channel.
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Waczynski et al. (2001) studied this question.
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