Answers are grounded in this paper and cite their sources.
In this paper, we demonstrate simultaneous AFM/NSOM using a dual‐tip normal tuning‐fork based scanning probe microscope. By scanning two SPM probes simultaneously, one dedicated for AFM with a standard tip diameter of 20 nm, and the second having a 150 nm aperture NSOM fiber with 200 nm thick gold coating, we combine the benefits of ∼20 nm spatial resolution from the AFM tip with the spectral information of a near‐field optical probe. The combination of simultaneous dual‐tip scanning enables us to decouple the requirements for high resolution topography and probe functionality. Our method represents a marked shift from previous applications of multi‐probe SPM where essentially a pump‐probe methodology is implemented in which one tip scans the area around the second. As a model system, we apply dual‐tip AFM/NSOM scanning to a sample of spin‐cast nano‐clustered Lumogen dyes, which show remarkable brightness and photochemical stability. We observe morphology features with a resolution of 20 nm, and a near‐field optical resolution of 150 nm, validating our approach.
No takes yet. Share an insight, caveat, or question.
Berezin et al. (2014) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: