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February 1, 1982IEEE Transactions on Electron Devices

A simple and accurate method to measure the threshold voltage of an enhancement-mode MOSFET

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Authors

HLHee‐Gook LeeSOSoo‐Young OhSamsung Medical CenterGFGeorge C. FullerLa Roche College

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Lee et al. (1982) studied this question.

synapsesocial.com/papers/6ab084068c96263f3bec9121https://doi.org/10.1109/t-ed.1982.20707
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