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April 1, 1979IEEE Transactions on Electron Devices

Analytical models of threshold voltage and breakdown voltage of short-channel MOSFET's derived from two-dimensional analysis

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TTT. ToyabeToyo UniversitySAS. AsaiEast Tennessee State University

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Toyabe et al. (1979) studied this question.

synapsesocial.com/papers/6a7e9e9bba437ed6d89739cchttps://doi.org/10.1109/t-ed.1979.19448
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