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December 1, 2009IEEE Transactions on Nuclear Science

Soft-Error Rate in a Logic LSI Estimated From SET Pulse-Width Measurements

Takahiro Makino Daisuke Kobayashi Kazuyuki Hirose Daisuke Takahashi Shigeru Ishii Masaki Kusano Shinobu Onoda Toshio Hira Takeshi Ohshima

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Abstract

SET-induced soft-error rates (SERSETs) of logic LSIs are estimated from SET pulse-widths measured in logic cells used in logic LSIs. The estimated rates are consistent with directly measured SERSETs for logic LSIs.

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Makino et al. (2009) studied this question.

synapsesocial.com/papers/6ab5c679a69432f3cbfb7c69 https://doi.org/10.1109/tns.2009.2033795

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Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

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