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December 1, 1995IEEE Transactions on Nuclear Science

An SEU analysis approach for error propagation in digital VLSI CMOS ASICs

M.P. Baze S. Büchner William G. Bartholet T.A. Dao

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Abstract

A probabilistic description of error propagation in complex circuits is formulated and solved as a set of linear equations. Comparisons are made with experimental data.

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Baze et al. (1995) studied this question.

synapsesocial.com/papers/6ab5c6bb9b12e8ca0e249dca https://doi.org/10.1109/23.489228

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