Analytical expressions reveal characteristics of field-effect transistors and semiconductor diodes, suggesting improved modeling approaches.
Analytical expressions are obtained for the characteristics of junction-gate field-effect transistors and internal-channel MOSFETs (transistors with both an -channel and a -channel are considered). Instead of the hyperbolic tangent function, which is used in the well-known Curtice-Eitenberg model, the new expressions are based on the volt-ampere characteristic of a semiconductor diode with ohmic resistance (using a special Lambert function). These expressions describe both linear mode, saturation mode, and cutoff mode. Four parameters are used. A method for accounting for the slope of the characteristics is also proposed (while adding another parameter). Examples of graphs constructed using the obtained expressions are presented.
No takes yet. Share an insight, caveat, or question.
А. Е. Kitaev (2025) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: