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October 1, 1997Journal of Applied Crystallography

Integrated Intensities Using a Six-Circle Surface X-ray Diffractometer

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EVElias VliegRadboud University Nijmegen

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Elias Vlieg (1997) studied this question.

synapsesocial.com/papers/6a0d404c48a82a5ce309ac76 https://doi.org/10.1107/s0021889897002537

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Synapse has enriched one closely related paper. Consider it for comparative context:

1International Tables for X-ray Crystallography1976 · 14,221 citations