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February 1, 1966IEEE Transactions on Electron Devices

Sodium distribution in thermal oxide on silicon by radiochemical and MOS analysis

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Authors

EYE. YonSystems Control (United States)WKWen H. KoState University of New YorkAKA. B. KuperUniversity of Illinois Urbana-Champaign

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Yon et al. (1966) studied this question.

synapsesocial.com/papers/6a702baeac440176ef28d188https://doi.org/10.1109/t-ed.1966.15680
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