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January 15, 1976Applied Physics Letters

X-ray topographic observation of dark-line defects in GaAs-Ga1−xAlxAs double-heterostructure wafers

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SKSeigô KishinoHimeji UniversityHNHisao NakashimaYokohama National UniversityNCN. ChinoneLevin Group (United States)

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Kishino et al. (1976) studied this question.

synapsesocial.com/papers/6a7236b1f44fa9f079dfc44fhttps://doi.org/10.1063/1.88655
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