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April 19, 2012International Journal of Microwave and Wireless Technologies

New pulsed measurement setup for GaN and GaAs FETs characterization

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Authors

ASAlberto SantarelliLaboratori Guglielmo Marconi (Italy)RCRafael CignaniMarconi UniversityDNDaniel NiessenMarconi University

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Santarelli et al. (2012) studied this question.

synapsesocial.com/papers/6a74fcfe4b0395c886dbe306https://doi.org/10.1017/s1759078712000335
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