We have measured two-dimensional Raman intensity images of laser-recrystallized polycrystalline silicon islands on insulators by a scanning Raman microprobe. It is found that crystallites with about ten µm size grow along the scanning direction of an annealing laser. The crystallographic orientations of the crystallites have been determined by Raman microprobe polarization measurements.
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Nakashima et al. (1986) studied this question.
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