Ion-sensitive field-effect transistors (ISFET's) have been fabricated by using silicon films on sapphire substrates (SOS). Using this structure SiO2, ZrO2, and Ta2O5films are examined as hydrogenion-sensitive materials, and Ta2O5film has been found to have the highest pH sensitivity (56 mV/pH) among them. The measured pH sensitivity of this SOS-ISFET's is compared with the theoretical sensitivity based on the site-binding model of proton dissociation reaction on the metal oxide film and good agreement between them is obtained.
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AKIYAMA et al. (1982) studied this question.
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