Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
December 1, 1972IEEE Transactions on Electron Devices

Characterization of thin-oxide MNOS memory transistors

View Full Paper
Ask AI
Bookmark
Share

Authors

MWM.H. WhiteKentucky Educational TelevisionJCJ.R. CricchiWestinghouse Electric (United States)

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

White et al. (1972) studied this question.

synapsesocial.com/papers/6a852065404dce2ee642e93chttps://doi.org/10.1109/t-ed.1972.17591
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Fowler-Nordheim Tunneling into Thermally Grown SiO21969 · 1,701 citations
  2. 2Tunneling from an Independent-Particle Point of View1961 · 626 citations
  3. 3Charge Transport and Storage in Metal-Nitride-Oxide-Silicon (MNOS) Structures1969 · 194 citations
  4. 4CHARGE STORAGE MODEL FOR VARIABLE THRESHOLD FET MEMORY ELEMENT1969 · 57 citations
  5. 5Characteristics of the Surface-State Charge (Qss) of Thermally Oxidized Silicon1967 · 714 citations