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February 1, 1985IEEE Transactions on Electron Devices

Analysis of kink characteristics in Silicon-on-insulator MOSFET's using two-carrier modeling

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Authors

KKK. KatōNagasaki UniversityTWT. WadaUniversity of MiyazakiKTKenji TaniguchiHiroshima University

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Katō et al. (1985) studied this question.

synapsesocial.com/papers/6a891784f1df03d55b28b7e1https://doi.org/10.1109/t-ed.1985.21963
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