The charge-voltage (Q-V) relationship of ferroelectric capacitors experiencing arbitrary applied voltages is investigated both theoretically and experimentally. The complex behavior and history dependence of a ferroelectric capacitor in response to arbitrary voltage patterns can be well described by a parallel-elements model. This approach not only describes all of the major properties of ferroelectric hysteresis but is also very easy to implement into existing circuit design/simulation tools.
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Jiang et al. (1997) studied this question.
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