Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
July 15, 1983Applied Physics Letters

Deactivation of the boron acceptor in silicon by hydrogen

View Full Paper
Ask AI
Bookmark
Share

Authors

CSChih‐Tang SahON Semiconductor (United States)JSJack Yuan-Chen SunTaiwan Semiconductor Manufacturing Company (Taiwan)JTJoseph Jeng-Tao TzouUniversity of Illinois Urbana-Champaign

Discussion

Loading...

Member takes

Overview

Key Points

Key points are not available for this paper at this time.

Cite This Study

Sah et al. (1983) studied this question.

synapsesocial.com/papers/6a8a93307f5a142c17c15002https://doi.org/10.1063/1.94287
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Characteristics of Fast Surface States Associated with SiO[sub 2]-Si and Si[sub 3]N[sub 4]-SiO[sub 2]-Si Structures1969 · 149 citations
  2. 2Determination of Kilovolt Electron Energy Dissipation vs Penetration Distance in Solid Materials1971 · 817 citations
  3. 3Diffusivity of oxygen in silicon during steam oxidation1982 · 183 citations
  4. 4Hydrogenation and dehydrogenation of amorphous and crystalline silicon1978 · 171 citations
  5. 5Identification of electron traps in thermal silicon dioxide films1981 · 138 citations