An integrated scanning tunneling, atomic force and lateral force microscope

We describe the design and operation of a combined scanning tunneling–atomic force–lateral force microscope [(STM), (AFM), (LFM)]. Including these capabilities in a single instrument reduces construction costs and increases flexibility. AFM and LFM may be performed simultaneously; a simple reconfiguration (requiring removing the AFM/LFM cantilever holder and replacing with a STM tip) changes the instrument into a STM. We present atomic forces depicted in force-to-distance curves and experimental imaging applications with all three techniques.