The modifications necessary to convert electron microscope specimen holders for use with field-ion microscope specimen tips are described. Microscopes having an immersion objective lens are most suitable, and a modified specimen holder constructed for one of these (Philips EM 200) was found to be particularly reliable and easy to use. As an example of use, comparative field-ion and electron micrographs are presented of a tungsten specimen showing a twin boundary at the tip.
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Nordén et al. (1967) studied this question.