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November 5, 2004Journal of Applied Physics

Magnetoresistance characterization of nanometer Si metal-oxide-semiconductor transistors

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YMY. M. MezianiUniversidad de SalamancaJŁJ. ŁusakowskiUniversity of WarsawWKW. KnapWarsaw University of Technology

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Meziani et al. (2004) studied this question.

synapsesocial.com/papers/6a93a972c71ca0043637d273https://doi.org/10.1063/1.1806991
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