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Describes the design and performance of a 64-kbit (65536 bits) block addressed charge-coupled serial memory. By using the offset-mask charge-coupled device (CCD) electrode structure to obtain a small cell size, and an adaptive system approach to utilize nonzero defect memory chips, the system cost per bit of charge-coupled serial memory can be reduced to provide a solid-state replacement of moving magnetic memories and to bridge the gap between high cost random access memories (RAM's) and slow access magnetic memories.
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Mohsen et al. (1976) studied this question.
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