Answers are grounded in this paper and cite their sources.
A scaling law on data retention statistics is presented for sub-20-nm phase-change random access memory with a confined cell structure. Nucleation and growth was modeled with phase-field method. Universality encompassing cell size, temperature, and active phase-change material was found.
No takes yet. Share an insight, caveat, or question.
Kwon et al. (2015) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: