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March 1, 1959Journal of Scientific InstrumentsOpen Access

Cryostat for measuring the electrical properties of high resistance semiconductors at low temperatures

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Authors

WMW H MitchellElectronics and Radar Development EstablishmentEPE H PutleyPhysikalisch-Technische Bundesanstalt

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Mitchell et al. (1959) studied this question.

synapsesocial.com/papers/6a9e684fe42e413fea367edbhttps://doi.org/10.1088/0950-7671/36/3/308
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