Thickness Dependence of Material Properties of Epitaxial Pb(ZrxTi1-x)O3 Films on Ir/(100) (ZrO2)1-x(Y2O3)x/(100)Si Structures

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Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

1. 1Characterization of Metal/Ferroelectric/Insulator/Semiconductor Structure with CeO₂ Buffer LayerOriginal Research · 1995 · 89 citations
2. 2Material Properties of Heteroepitaxial Ir and Pb(ZrxTi1-x)O3 Films on (100)(ZrO2)1-x(Y2O3)x/(100)Si Structure Prepared by SputteringOriginal Research · 1998 · 29 citations
3. 3Thickness-dependent electrical characteristics of lead zirconate titanate thin filmsOriginal Research · 1995 · 133 citations
4. 4Single-Target Sputtring Process for Lead Zirconate Titanate Thin Films with Precise Composition ControlOriginal Research · 1991 · 45 citations
5. 5Film Thickness Dependence of Dielectric Property and Crystal Structure of PbTiO3 Film Prepared on Pt/SiO2/Si Substrate by Metal Organic Chemical Vapor DepositionOriginal Research · 1993 · 55 citations