Imprint is known as a failure mechanism in ferroelectric capacitors due to a voltage shift in the hysteresis curve. A detailed study to investigate the time, temperature and bias voltage dependence of the voltage shift was performed on MOD SBT thin films. Lifetime extrapolation under operating conditions (125 °C) reveal values for the lifetime of well over ten years.
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Grossmann et al. (1998) studied this question.
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