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July 1, 2002Journal of Applied Physics

Structural and electrical characterization of AuTiAlTi/AlGaN/GaN ohmic contacts

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Authors

MFMichael W. FayUniversity of NottinghamGMGrigore MoldovanGalmed Pharmaceuticals (Israel)PBPaul D. BrownUniversity of Nottingham

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Cite This Study

Fay et al. (2002) studied this question.

synapsesocial.com/papers/6aa74ebc45ca485f116d1bf3https://doi.org/10.1063/1.1481960
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Also Consider

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