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May 19, 2009IEEE Microwave Magazine

AlGaN/GaN HFET reliability

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Authors

RTR.J. TrewOffice of the Secretary of DefenseDGDaniel GreenUniversity of MiamiJSJ.B. ShealyCanandaigua VA Medical Center

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Trew et al. (2009) studied this question.

synapsesocial.com/papers/6aa774ed23d56a6967038cd1https://doi.org/10.1109/mmm.2009.932286
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  1. 1SThM Temperature Mapping and Nonlinear Thermal Resistance Evolution With Bias on AlGaN/GaN HEMT Devices2007 · 94 citations
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