Variation in proton-induced upsets rates from large solar flares using an improved SEU model

Proton integral flux measurements during solar energetic particle (SEP) events, from the CPME instrument onboard the IMP-8 satellite, and the proton detector on the GOES-7 satellite, are utilized to calculate proton-induced single-event upset (SEU). An improved two-parameter SEU cross section model is used for three RAM devices. The log of the 239 actual RAM upsets on the TDRS-1 satellite during the October 19, 1989 SEP event allowed a comparison between the recorded number of upsets/chip per day and those predicted based on the GOES-7 data, the two-parameter model, and the shielding distribution curve.>