Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
May 1, 1992IEEE Electron Device Letters

Use of noise thermometry to study the effects of self-heating in submicrometer SOI MOSFETs

View Full Paper
Ask AI
Bookmark
Share

Authors

RBR.J.T. BunyanMUMichael J. UrenUniversity of BristolJAJ. AldermanJohn Innes Centre

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Bunyan et al. (1992) studied this question.

synapsesocial.com/papers/6ab1eb915df832bf8173dd76https://doi.org/10.1109/55.145053
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched one closely related paper. Consider it for comparative context:

  1. 1Physical origin of negative differential resistance in SOI transistors1989 · 118 citations