The article discusses how charge propagation and parasitic channel formation affect integrated circuits, indicating prevention strategies.
The article deals with the problems of failures of integrated circuits (IC) caused by the effects of charge propagation and the formation of parasitic channels and their prevention at the initial stages of design. In addition, the issues related to these refusals are considered, summarized and systematized. The article presents some practical examples that take into account modern methods and techniques of designing and manufacturing ICS, which can be used to improve their reliability, taking into account current trends in the development of microelectronics.
No takes yet. Share an insight, caveat, or question.
Vladimir Shubin (2024) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: