This article examines integrated circuit failures caused by debiasing effects, suggesting design improvements for reliability.
The article studies the problem of failures in the operation of integrated circuits (ICs) caused by debiasing substrate effect and its preventative techniques at the initial stages of design. In addition, issues related to abandoning enemies are considered, summarized and systematized. The article provides some practical examples that teach modern methods and techniques for designing and manufacturing ICs, which can be used to improve their reliability, taking into account modern trends in the development of microelectronics.
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Vladimir Shubin (2025) studied this question.
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