Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
September 1, 2004IEEE Transactions on Device and Materials Reliability

Reliability Study of Phase-Change Nonvolatile Memories

View Full Paper
Ask AI
Bookmark
Share

Authors

APA. PirovanoMicron (Italy)ARAndrea RedaelliIstituto Clinico Sant'AmbrogioFPF. PellizzerMicron (United States)

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Pirovano et al. (2004) studied this question.

synapsesocial.com/papers/6a7009def44fa9f079dd8ec8https://doi.org/10.1109/tdmr.2004.836724
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched one closely related paper. Consider it for comparative context:

  1. 1The mechanism of threshold switching in amorphous alloys1978 · 408 citations