Simulation experiments for determining the effects of single event upsets on microprocessor program flow are described. A 16 bit microprocessor is modeled using a hardware description language. Using pseudorandom selection of event time and effected flip-flop, SEU's are injected into the microprocessor model. Upset detectors are modeled along with the microprocessor for determination of fault coverage of several candidate fault detection techniques.
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Li et al. (1984) studied this question.
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